Regensburg 2013 – scientific programme

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MM: Fachverband Metall- und Materialphysik

MM 11: Topical Session: TEM-Symposium - STEM

MM 11.1: Topical Talk

Monday, March 11, 2013, 15:45–16:15, H4

Scanning transmission electron microscopy at atomic resolution — •Ferdinand Hofer, Gerald Kothleitner, and Werner Grogger — Institut für Elektronenmikroskopie und Feinstrukturforschung, Technische Universität Graz, Steyrergasse 17, A-8010 Graz, Österreich

Advanced electron microscopy is making a vital contribution to the discoveries taking place in many areas of materials science. Especially, the advantages in aberration corrected TEM and STEM instrumentation now provide necessary background for solving materials science problems at the nanometer or even atomic scale. This is especially true of aberration corrected STEM which brings with it analytical techniques such as electron energy-loss spectroscopy (EELS) and the new silicon drift detector systems for x-ray spectrometry. In this paper we present how modern aberration corrected STEM systems can be used to examine the local chemistry and also the physical properties of energy-related materials, e.g. nanocomposite solar cells, solid oxide fuel cell cathodes and the optical properties of nanoparticles.