Regensburg 2013 – wissenschaftliches Programm

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MM: Fachverband Metall- und Materialphysik

MM 12: Computational Materials Modelling - Mechanical Properties

MM 12.10: Vortrag

Montag, 11. März 2013, 18:00–18:15, H24

Direction Dependent Field Evaporation of Pure Materials in Atom Probe Tomography — •Torben Boll and Talaat Al-Kassab — King Abdullah University of Science and Technology, Division of Physical Sciences and Engineering, Thuwal, 23955-6900, Saudi Arabia

In the field of atom probe tomography (APT) the process of field evaporation governs the progress of an analysis. The field evaporation field (FEF) is known to exhibit different strengths for different crystallographic directions for pure metals. However this is not considered in currently used APT-models. This paper will present a method to calculate small differences in the FEF for crystallographic directions from experimental APT data of Al, W and Si. Furthermore we will discuss how this can be used to adjust parameters for geometry based APT-simulations.

To obtain this information we developed an upgraded version of the AtomVicinity algorithm, which is mostly identical to what is also called *spatial distribution maps*.

The results were acquired with two different commercial atom probes, the Laser assisted Wide Angle Atom Probe (LA-WATAP) and the Local Electrode Atom Probe (LEAP 4000). Additionally, this approach allows a comparison of the spatial resolution of these two devices.