Regensburg 2013 – wissenschaftliches Programm

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MM: Fachverband Metall- und Materialphysik

MM 15: Poster Session

MM 15.52: Poster

Montag, 11. März 2013, 18:00–20:00, Poster E

Full-Scale Modeling of APT Measurement Data — •Christian Oberdorfer, Sebastian Manuel Eich, and Guido Schmitz — Institut für Materialphysik, Münster, Deutschland

The application of simulation enables a complementary approach to the interpretation of measurement results in atom probe tomography (APT). A very first approach to APT simulation was introduced by Vurpillot et al. The approach makes use of an iterative solution of the Laplace equation on a regular grid. Atoms of a modelled field emitter structure are consecutively detached from the surface and respective ion-trajectories are calculated. Consistent with the experimental condition in which a position sensitive detector is placed in front of the emitter sample, the simulated data result in the lateral hit positions of the ions on a simulated detector plane.

The present contribution depicts recent results which were obtained from an extended simulation approach for APT. Founded on an elaborated grid of irregular shaped Wigner-Seitz cells, the potential distribution can be solved without any constraints on the possible emitter geometry. Conceivable emitter structures consist of distinguished lattice types and orientations which reflect realistic atomic distributions. Even the analysis of amorphous structures is possible. Additionally, an adaptive grid of support points allows to extend the simulation space decisively. Ion trajectories with flightlengths of about 10 cm are enabled. --- The respective ``TAPSim'' simulation package is freely offered.