Regensburg 2013 – wissenschaftliches Programm
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MM: Fachverband Metall- und Materialphysik
MM 15: Poster Session
MM 15.83: Poster
Montag, 11. März 2013, 18:00–20:00, Poster E
Voltage contrast in SEM for revealing charge transport through metallic nanowire transparent electrodes — •Stefanie Spallek1, Johannes Krantz2, Peter Kubis2, Johannes Holzmair3, Silke Christiansen3, Christoph J. Brabec2, Benjamin Butz1, and Erdmann Spiecker1 — 1CENEM, University of Erlangen-Nürnberg — 2I-MEET, University of Erlangen-Nürnberg — 3MPI for the Science of Light, Erlangen
Metallic nanowire (NW) transparent electrodes are of special interest in research and economy due to their cheap and scalable printing production process, their high optical and electrical quality and their application possibility to flexible devices. However charge transport through metallic NW networks is not yet well understood. Here, we report on a voltage contrast dependent scanning electron microscopy (VC-SEM) study of metallic NW electrodes near the electrical percolation threshold. As the properties of NW junctions within the network directly lead to the properties of the whole electrode, e.g. sheet resistance, they are of special interest in this study. NW junctions are insolating until the voltage threshold is reached, whose value presumably is depending on the insulating layer of process residues. By exceeding the voltage threshold the NW junction seems not to balance the amount of charge carriers on both sides, though. Therefore, the contrast mechanism of VC-SEM of metallic NWs was studied to quantify the voltage difference. In addition we show a VC-SEM study of metallic NW electrodes ready for application with which a potential drop of 0 to 8 Volts over a distance of several microns was observed.