Regensburg 2013 – scientific programme

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MM: Fachverband Metall- und Materialphysik

MM 15: Poster Session

MM 15.86: Poster

Monday, March 11, 2013, 18:00–20:00, Poster E

In-situ and ex-situ ACOM-STEM analysis of the direction dependent deformation behavior of nanotwinned copper — •Aaron Kobler^{1, 2}, M. Funk³, C. Eberl³, A. Hodge⁴, Horst Hahn^{1, 2}, and Christian Kübel¹ — ¹Karlsruhe Institute of Technology (KIT), Institute of Nanotechnology, 76021 Karlsruhe, Germany — ²Technische Universität Darmstadt (TUD), KIT-TUD Joint Research Laboratory Nanomaterials, 64287 Darmstadt, Germany — ³Karlsruhe Institute of Technology (KIT), Institute of Applied Materials, 76021 Karlsruhe, Germany — ⁴University of Southern California, Department of Aerospace and Mechanical Engineering, Los Angeles, California 90089-1453, USA

Nanotwinned (nt) metals as a class of nanostructured materials have been receiving considerable attention as they combine the high strength of nanocrystalline (nc) metals with a higher ductility and higher thermal stability compared to the corresponding nc metals. Face-centered cubic metals with low stacking fault energy like Cu have the tendency to develop this kind of nt structure. Although twin boundaries are thermodynamically more stable than random grain boundaries, they can become unstable under mechanical load. The deformation behavior of magnetron sputtered nt Cu was studied using ex-situ and in-situ TEM techniques combining classical BF/DF-TEM analysis with the recently developed automated crystal orientation mapping (ACOM-TEM). Two straining directions were tested in-situ, one parallel to the twin plane and one perpendicular to it and compared to the ex-situ deformation parallel to the twin plane on ~20μm thick bulk samples. The straining experiments show a significant difference between bulk and thin film deformation as well as a strong orientation dependence in the thin film.