MM 21: Topical Session: TEM-Symposium - HR Imaging & Analytic II
Dienstag, 12. März 2013, 11:45–13:00, H4
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11:45 |
MM 21.1 |
Energy dispersive X-ray spectroscopy using silicon drift detectors in TEM; state and prospects — •Meiken Falke
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12:00 |
MM 21.2 |
Electron microscopy study of Y-doped BSCF — •Matthias Meffert, Philipp Müller, Heike Störmer, Christian Niedrig, Stefan F. Wagner, Ellen Ivers-Tiffée, and Dagmar Gerthsen
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12:15 |
MM 21.3 |
The contribution has been withdrawn.
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12:30 |
MM 21.4 |
Topical Talk:
Surface plasmon coupling studies through near-field mapping of electromagnetic modes in electron microscopy — Burcu Ögüt, Nahid Talebi, Wilfried Sigle, Ralf Vogelgesang, and •Peter A. van Aken
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