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MM: Fachverband Metall- und Materialphysik
MM 36: Topical Session: TEM-Symposium - Structure-Property / In-Situ II
MM 36.4: Topical Talk
Wednesday, March 13, 2013, 12:30–13:00, H25
In-situ transmission electron microscopy — •Henny Zandbergen — Kavli Institute of Nanoscience, TUDelft, Delft, The Netherlands
After a decade of great improvements in the optical performances of high-resolution electron microscopes, the developments in the next decade of transmission electron microscopy (TEM) will be mainly in the development of in-situ electron microscopy and 3D analysis on the atomic level. In Delft we have focused on in-situ (TEM), using in part MEMS (micro electro mechanical systems) devices to overcome size related problems due to the limited available space in the TEM for sample manipulation. In Delft we are using routinely MEMS based holders for heating, for applying electrical currents and heating under a gas atmosphere.
In the talk in-situ TEM examples will be given of electromigration in metal nanobridges, (de)hydrogenation of hydrogen storage materials, changes in the shapes and crystal structures of semiconductor nanoparticles and the sculpting of grapheme into nanoribbons.