MM 44: Topical Session: TEM-Symposium - In-Situ II
Mittwoch, 13. März 2013, 16:30–17:45, H25
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16:30 |
MM 44.1 |
Nanoscale investigation of metal-induced crystallization (MIC) and related mass transport by in-situ TEM/STEM — Balaji Birajdar, Simon Kraschawski, Benjamin Butz, Tobias Antesberger, Martin Stutzmann, and •Erdmann Spiecker
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16:45 |
MM 44.2 |
Topical Talk:
In-situ environmental TEM studies of oxide electro-catalysts — •Christian Jooss, Stephanie Raabe, Daniel Mierwaldt, Jim Ciston, Matthé Uijttewaal, Jörg Hoffmann, Peter Blöchl, and Yimei Zhu
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17:15 |
MM 44.3 |
Dynamic atomic-scale observation of catalysts in their functional state by aberration-corrected environmental transmission electron microscopy (ETEM) — •Joerg Jinschek
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17:30 |
MM 44.4 |
Electron-beam-stimulated mechanical engineering of nanoscaled amorphous silica — •Mirza Mackovic and Erdmann Spiecker
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