Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe

O: Fachverband Oberflächenphysik

O 35: Poster Session I (Metal, semiconductor and oxide substrates: structure and adsorbates; Graphene)

O 35.20: Poster

Dienstag, 12. März 2013, 18:15–21:45, Poster B1

Adsorption geometry and chemical structure investigations of organic molecules with atomic force microscopy using functionalized tips — •Bruno Schuler, Leo Gross, Fabian Mohn, Nikolaj Moll, and Gerhard Meyer — IBM Research - Zurich, 8803 Rueschlikon, Switzerland

Atomic force microscopy (AFM) with functionalized tips has proven to achieve intra-molecular contrast due to Pauli repulsion [1]. Crucial factors affecting the image contrast are the tip termination, intra-molecular chemical differences and adsorption geometry of the adsorbate. Here we present investigations on all of these three contrast decisive factors. Particularly, we investigated the contrast characteristics of several tip apices (Cl, Br, CO, NO, Xe, Kr) for scanning tunneling microscopy and AFM imaging and developed a new tip preparation method for halogens based on dissociation from molecule precursors [2]. Furthermore, using the high-resolution of the CO tip, we could distinguish bond-order differences in aromatically bonded hydrocarbon molecules [3].

References:

[1] L. Gross, F. Mohn, N. Moll, P. Liljeroth, G. Meyer, Science 325, 1110 (2009)

[2] F. Mohn, B. Schuler, L. Gross, G. Meyer, submitted

[3] L. Gross, F. Mohn, N. Moll, B. Schuler, A. Criado, E. Guitián, D. Peña, A. Gourdon, G. Meyer, Science 337, 1326 (2012)