Regensburg 2013 – scientific programme

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O: Fachverband Oberflächenphysik

O 36: Poster Session II (Organic films and electronics, photoorganics; Nanostructures; Plasmonics and nanooptics, Surface chemical reactions and heterogeneous catalysis, Surface dynamics )

O 36.19: Poster

Tuesday, March 12, 2013, 18:15–21:45, Poster B2

Investigation of surface plasmons on structured surfaces — •Tammo Böntgen¹, Jan Lorbeer², Marc Teichmann², Frank Frost², Rüdiger Schmidt-Grund¹, and Marius Grundmann¹ — ¹Universtät Leipzig, Institut für Experimentelle Physik II, Linnéstr. 5, Germany — ²Leibniz-Institut ür Oberflächenmodifizierung e.V., Permoserstr. 15, Leipzig, Germany

Nanoscale ripple pattern with a period of ≈90 nm were formed on SiO₂ surfaces by low-energy ion beam erosion (E_ion < 2 keV) at oblique ion incidence angles. The pattern was than coated with a gold film of ≈40 nm thikness. A Kretschmann configuration with a SiO₂ prism was used to allow surface plasmon excitation at the gold/air interface. Subsequently the sample was analyzed using a spectroscopic ellipsometer in the range from 370 nm - 1700 nm and angles of incidence (AOI) between 40^∘ - 45^∘. This setup is similar to attenuated-total-internal-reflection readily used for study of surface plasmons. With this setup we were able to unravel a strong dependence of the surface plasmon resonance (SPR) frequency and strength on the in-plan orientation of the sample and the AOI. While the SPR is mostly independent of the in-plane orientation at AOI close to 45^∘ a strong frequency shift with rotation is observed at smaller AOI. Similarly the strength of the SPR also changes with the in-plain orientation. In combination at 42^∘ AOI a strong resonance at 860 nm is observed. This resonance vanishes if the sample is rotated by 90^∘.