Regensburg 2013 – scientific programme
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O: Fachverband Oberflächenphysik
O 39: Graphene: Characterization and Devices (jointly with DS, HL, MA, and TT)
O 39.7: Talk
Wednesday, March 13, 2013, 11:00–11:15, H17
Characterization of large-scale graphene CVD with far-infrared radiation — •Christian Cervetti1, Boris Gorshunov1,4,5, Elena Zhukova1,4,5, Martin Dressel1, Klaus Kern2,3, Marko Burghard2, and Lapo Bogani1 — 11. Physikalisches Institut, Universität Stuttgart — 2Max Planck Institut für Festkörperforschung — 3Institute de Physique de la Matière Condensée, Ecole Polytechnique de Lausanne, Switzerland — 4A.M.Prokhorov General Physics Institute, Russian Academy of Sciences, Russia — 5Moscow Institute of Physics and Technology (State University), Russia
We use monochromatic terahertz (THz) spectrometer and standard Fourier-transform spectrometer to measure the conductance of large scale single layer graphene obtained by chemical vapor deposition. We demonstrate the extreme sensitivity of the THz conductance to copper particles produced on graphene during the transfer process, making THz spectroscopy a powerful tool for monitoring the removal of unwanted leftovers during the production of large scale graphene samples.