Regensburg 2013 – scientific programme

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O: Fachverband Oberflächenphysik

O 44: Scanning Probe Methods I

O 44.5: Talk

Wednesday, March 13, 2013, 11:30–11:45, H33

Technical limitations in dynamic mode high-speed AFM imaging — •Anne-D. Müller and Falk Müller — Anfatec Instruments AG, Melanchthonstr. 28, 08606 Oelsnitz, Germany

As the availability of AFM probes and digital control technology have improved substantially within the past decade, high-speed imaging in contact and dynamic mode AFM became an achievable goal for current instrumentation development. In order to reasonably track the topology of the surface, the most important target of current investigations is the response time of the digital feedback loop. This contribution presents a technical solution for the direct determination of the frequency dependent disturbance rejection of digital feedback loops considering the whole system including the cantilever, the lockin amplification and all required A/D and D/A converters. It will be shown that the cantilever itself remains as bottleneck for the further increase of the imaging speed in dynamic mode. Results acquired with different commercially available high-speed cantilevers will be compared.