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Regensburg 2013 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 53: Scanning Probe Methods II

Mittwoch, 13. März 2013, 16:00–19:15, H31

16:00 O 53.1 Driving a Macroscopic Oscillator with the Stochastic Motion of a Hydrogen Molecule — •Christian Lotze, M. Corso, K.J. Franke, F. v. Oppen, and J.I. Pascual
16:15 O 53.2 Improvement of STM Resolution with H-sensitized TipsJose Ignacio Martínez, •Enrique Abad, César González, Fernando Flores, and José Ortega
16:30 O 53.3 Mapping the surface adsorption potential with the scanning tunneling microscope — •Georgy Kichin, Christian Wagner, Stefan Tautz, and Ruslan Temirov
16:45 O 53.4 Voltage pulse shapes in time-resolved STM measured with photons — •Markus Etzkorn, Christoph Große, Klaus Kuhnke, Sebastian Loth, and Klaus Kern
17:00 O 53.5 Investigation of the stiffness of the BN-nanomesh by combined STM and AFM measurements at low temperatures — •Tobias Herden, Markus Ternes, and Klaus Kern
17:15 O 53.6 Nanoscale imaging of photoelectrons using an atomic force microscope — •Ping Yu and Jürgen Kirschner
17:30 O 53.7 The effect of sample resistivity on Kelvin probe force microscopy — •Alfred J. Weymouth and Franz J. Giessibl
17:45 O 53.8 Three dimensional scanning lifetime microscopy using diamond — •Philip Engel, Andreas W. Schell, and Oliver Benson
18:00 O 53.9 Utilizing dynamic work function measurements to distinguish adsorbates on Si(100) — •Ferdinand Huber, Alfred J. Weymouth, and Franz. J. Giessibl
18:15 O 53.10 Probing the probe: tip front atom characterization — •Florian Pielmeier and Franz J. Giessibl
18:30 O 53.11 Theoretical Scanning Probe Images of the (001) Surfaces of MnO and NiO — •Mihail Granovskij, Andreas Schrön, and Friedhelm Bechstedt
18:45 O 53.12 Scanning Microwave Microscopy combined with Amplitude Modulation Atomic Force Microscopy — •Matthias A. Fenner
19:00 O 53.13 Infrared nanoscopy of biomaterialsAdrian Cernescu, Sergiu Amarie, Tobias Geith, Stefan Milz, and •Fritz Keilmann
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