Regensburg 2013 – wissenschaftliches Programm
Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
O: Fachverband Oberflächenphysik
O 53: Scanning Probe Methods II
O 53.5: Vortrag
Mittwoch, 13. März 2013, 17:00–17:15, H31
Investigation of the stiffness of the BN-nanomesh by combined STM and AFM measurements at low temperatures — •Tobias Herden1, Markus Ternes1, and Klaus Kern1,2 — 1Max Planck Institute for Solid State Research, Heisenbergstrasse 1, 70569 Stuttgart, Germany — 2Institut de Physique des Nanostructures, Ecole Polytechnique Fédérale de Lausanne, 1015 Lausanne, Switzwerland
The single layer boron-nitride nanomesh on Rh(111) [1] was intensively investigated by an homebuilt combined STM-AFM operating in the qPlus setup [2] at low temperatures with sub-nm oscillation amplitudes. From 3D-frequency shift data we calculated the energy landscape and lateral and vertical forces acting between the tip and the BN-layer. Slight variations in the forces between the (top, hcp)- and the (fcc, hcp)-sites (i.e. the different alignments of the rim sites of the hexagonal corrugation in respect to the Rh surface) enable us to derive stiffness properties of the highly corrugated layer. Our local results are further supported by statistical evaluation of atomic-scale AFM measurements of the lateral displacement of the BN-hexagons. To get a more profound understanding of the mechanical properties of the insulating single layer system, our experimental findings are compared with theoretical calculations by Laskowski et al. [3,4].
[1] M. Corso, Science 202, 217 (2004)
[2] F. J. Giessibl, Appl. Phys. Lett. 73, 3956 (1998)
[3] R. Laskowski et al., Phys. Rev. Lett. 98, 106802 (2007)
[4] R. Laskowski et al., Phys. Rev. B 81, 075418 (2010)