Regensburg 2013 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 58: Poster Session III (Solid-liquid interfaces; Scanning probe and other methods; Electronic structure theory; Spin-orbit interaction)

O 58.33: Poster

Mittwoch, 13. März 2013, 18:15–21:45, Poster B1

Combined XPS and XAS Analysis Using the Software UNIFIT 2013 — •Ronald Hesse, Reinhard Denecke, and Martin Welke — Universität Leipzig, Wilhelm-Ostwald-Institut, 04103 Leipzig, Linnéstr. 2

A combination of X-ray absorption spectroscopy (XAS) and x-ray photoelectron spectroscopy (XPS) using synchrotron radiation with variable energy and polarized soft x-rays with high resolution and high flux is a powerful technique to observe atomic compositions and electronic state of surfaces of materials. In order to extract the maximum of information of the studied material a spectrum fit for both methods has to be done. The newest version of the software UNIFIT allows the combined spectrum processing and peak fit of XPS and XAS measurement data. The different theoretical description of the spectral background of XA spectra was implemented in the software. Additionally, the input routine was expanded for the reading of four special XAS data formats (NEXAFS, BESSY-EMP/2, LUND-MAXlab Scan Zeiss, 1. Column: Photon Energy - 2. Column: Intensity). The peak fit of a XA and XP spectrum of Ti 2p as well as a XMCD study of a thin Co film on BaTiO2 demonstrate the new possibilities of the improved software UNIFIT 2013.