Regensburg 2013 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 58: Poster Session III (Solid-liquid interfaces; Scanning probe and other methods; Electronic structure theory; Spin-orbit interaction)

O 58.42: Poster

Mittwoch, 13. März 2013, 18:15–21:45, Poster B1

4-Tip STM Transport Measurements on Si(111)-7x7 — •Marcus Blab, Matthias Wunde, Vasily Cherepanov, Peter Coenen, and Bert Voigtländer — Forschungszentrum Jülich, Peter Grünberg Institut, 52425 Jülich, Germany and JARA-Fundamentals of Future Information Technology

An ultra compact 4-tip STM was constructed in order to investigate the charge transport on the nanoscale. An n-doped Si(111)-7x7 sample was chosen as a first test sample. We will present atomic resolution images with all four tips and distance dependent 4-tip transport measurements of this surface. These measurements are compared with finite elements calculations, which show a strong tip distance dependence of the current density. Furthermore the calculations show a possibility to suppress the bulk in order to measure the surface conductance of Si(111)-7x7.