Regensburg 2013 – scientific programme

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O: Fachverband Oberflächenphysik

O 58: Poster Session III (Solid-liquid interfaces; Scanning probe and other methods; Electronic structure theory; Spin-orbit interaction)

O 58.45: Poster

Wednesday, March 13, 2013, 18:15–21:45, Poster B1

Atomic Resolution on KBr (100) Achieved by Means of KPFM and nc-AFM — •Timm Volkmann, Aaron Gryzia, Armin Brechling, and Ulrich Heinzmann — Molecular and Surface Physics, Bielefeld University

We modified an Omicron UHV AFM/STM for Kelvin Probe Force Microscopy (KPFM). The modified setup consists out of a nanoSurf easy PLL plus Controller/Detector for AFM, and a Signal Recovery DSP Lock-in Amplifier and SRS Analog PID Controller for KPFM. Cleaving potassium bromid (KBr) under ambient conditions and consecutive heating provides a clean surface for atomic imaging. We did research regarding different baking parameters. Annealing reduces contamination and electrostatic forces on the sample surface. Finally, cleaving the crystal in-situ provides a significant improvement of the image quality in the contact potential difference (CPD) and topography data.