Regensburg 2013 – wissenschaftliches Programm

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O: Fachverband Oberflächenphysik

O 58: Poster Session III (Solid-liquid interfaces; Scanning probe and other methods; Electronic structure theory; Spin-orbit interaction)

O 58.7: Poster

Mittwoch, 13. März 2013, 18:15–21:45, Poster B1

Atomic resolution under ambient conditions with a qPlus force sensor — •Daniel S. Wastl, Alfred J. Weymouth, and Franz J. Giessibl — University of Regensburg, Regensburg, 93053, Germany

Frequency modulation atomic force microscopy (FM-AFM) is the preferred method to obtain high resolution AFM. So far, FM-AFM has mainly been employed in ultrahigh vacuum, but recently, atomic resolution has been obtained by FM-AFM in liquid [1] under ambient conditions with silicon cantilevers and by the qPlus sensor [2] in liquid [3]. The qPlus sensor is attractive, because it is self-sensing and thus does not require optical deflection measurements. Moreover, it has a higher quality factor in ambient conditions and should be competitive to silicon cantilevers in its noise performance [4, 5, 6]. However, we observed severe challenges due to a large change in cantilever damping on its transition from air to the adsorption layer / sample interface. Here, we provide atomic resolution on cleaved KBr (001) and of cleaved muscovite mica(001) under ambient conditions in a quality similar to data obtained in ultrahigh vacuum.

[1] T. Fukuma et al, Appl. Phys. Lett., 87, 034101 (2005)

[2] F. J. Giessibl, Appl. Phys. Lett., 76, 1470 (2000)

[3] T. Ichii et al, Jpn. J. Appl. Phys. 51 (2012)

[4] F. J. Giessibl et al, Phys. Rev. B 84, 125409(2011)

[5] E. Köstner, PhD thesis (2012)

[6] E. Wutscher at al, Rev. Sci. Instrum. 82, 093703 (2011)