Regensburg 2013 – scientific programme
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O: Fachverband Oberflächenphysik
O 79: Oxide Surfaces III
O 79.3: Talk
Thursday, March 14, 2013, 16:30–16:45, H45
Stress measurements during growth of BaTiO3 and SrTiO3 films on Pt(001) — •Jörg Premper, Dirk Sander, and Jürgen Kirschner — Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, 06120 Halle, Germany
The measurement of film stress by the cantilever deflection technique is well established to study the correlation between stress and physical properties with monolayer sensitivity for metal-on-metal epitaxy [1]. The epitaxy of functional oxides such as BaTiO3 (BTO) and SrTiO3 (STO) requires experimental conditions, which deviate sharply [2] from that of metal epitaxy. A high substrate temperature (700∘C) and a substantial oxygen partial pressure (1×10−4 mbar) during film growth by pulsed laser deposition (PLD) are necessary for good epitaxial growth, but challenging for stress measurements in view of thermal drift and oxidation of the sample holder. An experimental setup is described, which allows quantitive stress measurements under these conditions. We present the first stress measurements during PLD of epitaxial BTO and STO monolayers on Pt(001). We find that the deposition of 20 ML BTO on Pt(001) (misfit = -1.9%) leads to a compressive film stress of -4.2 GPa, whereas the deposition of STO (misfit = +0.4%) induces a tensile stress of +1.2 GPa. The measured film stress is for both systems in good agreement with calculated misfit-induced stress.
[1] J. Premper, D. Sander, and J. Kirschner, Rev. Sci. Instr. 83, 073904 (2012)
[2] J. Schwarzkopf, R. Fornari, Prog. Cryst. Growth Charact. 52, 159-212 (2006)