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TT: Fachverband Tiefe Temperaturen

TT 40: Poster Session Correlated Electrons

TT 40.30: Poster

Mittwoch, 13. März 2013, 15:00–19:00, Poster D

Seebeck measurements on Pt-C FEBID nanostructures — •Heiko Reith^1,3, Roland Sachser¹, Matthias C. Schmitt², Friedemann Voelklein³, and Michael Huth¹ — ¹Physikalisches Institut, Goethe-University, Frankfurt am Main, Germany — ²Guenter Effgen GmbH, Herrstein, Germany — ³IMtech, Hochschule Rhein Main, Ruesselsheim, Germany

We investigated the thermo voltage of Pt-C granular metals fabricated by focused electron beam-induced deposition (FEBID) using trimethyl (methylcyclopentadienyl) platinum (IV) as precursor. The FEBID structures were deposited on specially designed microchips that allow measuring the Seebeck-coefficient of the samples. The electronic intergrain-coupling strength of the samples was tuned by post-growth electron-irradiation. Controlled by in situ measurement of the electrical conductivity of the deposits electrical conducting, insulator-to-metal transition and insulating samples were obtained by post-irradiation. We present the used microchip and results of the electrical conductivity and the Seebeck-coefficient measurements of the Pt-C granular samples in a temperature range from room to liquid 4He temperature and compare our results with theory.