Regensburg 2013 – wissenschaftliches Programm

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TT: Fachverband Tiefe Temperaturen

TT 71: Graphene - Preparation and Characterization 2 (jointly with DS, HL, MA, and O)

TT 71.9: Vortrag

Freitag, 15. März 2013, 12:30–12:45, H17

XPS Analysis of Wet-Chemically Prepared Graphene Oxide — •Ole Lytken, Michael Röckert, Jie Xiao, Christian Papp, Hans-Peter Steinrück, Siegfried Eigler, Michael Enzelberger, Stefan Grimm, Philipp Hofmann, Wolfgang Kroener, Christoph Dotzer, Paul Müller, and Andreas Hirsch — Universität Erlangen-Nürnberg

Graphene is one of the most studied materials of the last few years, but large scale production of high-quality graphene remains a challenge. One approach to a large scale production of graphene is the oxidation of graphite to graphite oxide, which can be exfoliated to graphene oxide and subsequently reduced to graphene. The challenge of this method is to keep the carbon structure intact during oxidation. We report on the XPS analysis of graphene oxide produced by a mild synthesis method that keeps the carbon structure intact and allows the reduction back to high-quality graphene. Only carbon with a single bond to one neighboring oxygen atom is observed (e.g. alcohols, expoxides or ethers), but no carbonyl (C=O) or carboxyl (-COOH) groups are found. Some common problems related to the interpretation of graphene oxide XPS spectra in the presence of charging and sulfur impurities will be touched upon.

Support by the SFB 953 and the Alexander-von-Humboldt Foundation is gratefully acknowledged.