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A: Fachverband Atomphysik
A 14: Poster: Precision spectroscopy of atoms and ions (with Q)
A 14.27: Poster
Montag, 17. März 2014, 16:30–18:30, Spree-Palais
Highly charged ions as new X-ray standard for synchrotrons — •Sven Bernitt1,2, Thomas Stöhlker2, and José Ramon Crespo López-Urrutia1 — 1Max-Planck-Institut für Kernphysik, Heidelberg, Germany — 2IOQ, Friedrich-Schiller-Universität, Jena, Germany
Atomic transitions excited by lasers are an established and extremely precise wavelength standard in the optical region. In contrast, work in the X-ray region has to rely on crystallographic standards or K-edge absorption. To overcome the limitations of those methods we aim at establishing transitions in highly charged ions (HCI) as new X-ray standards. To this end we use electron beam ion traps (EBIT) to provide targets of highly charged ions for synchrotron radiation. We present results of precise wavelength measurements of He-like Fe [1] and Kr at the synchrotron PETRA III, as well as a new experimental setup based on a small EBIT with permanent magnets. The latter will provide means of linking transitions in HCI to other wavelength standards, like the 57Fe Mößbauer wavelength, and ultimately a precise calibration of the dynamics beamline P01 at PETRA III.
[1] J. K. Rudolph et al., Phys. Rev. Lett. 111, 103002 (2013).