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A: Fachverband Atomphysik
A 35: Poster: Interaction with VUV and X-ray light
A 35.4: Poster
Mittwoch, 19. März 2014, 16:30–18:30, Spree-Palais
Electron beam ion traps at ultrabrilliant light sources — •Sven Bernitt1,2, René Steinbrügge1, Jan Rudolph1,3, Sascha Epp4, and José Ramon Crespo López-Urrutia1 — 1Max-Planck-Institut für Kernphysik, Heidelberg, Germany — 2IOQ, Friedrich-Schiller-Universität, Jena, Germany — 3IAMP, Justus-Liebig-Universität, Gießen, Germany — 4Max Planck Advanced Study Group, CFEL, Hamburg, Germany
Many plasma properties are determined by the interaction of highly charged ions with photons. In the VUV and X-ray spectral region usually only the time reversed processes were accessible. With the newest generation of ultrabrilliant light sources it is now possible to directly study photonic interactions. We present results obtained with the transportable electron beam ion trap FLASH-EBIT [1], that was used to provide targets of various highly charged ion species for synchrotrons (BESSY II, PETRA III) and free-electron lasers (FLASH, LCLS). By resonantly exciting VUV and X-ray transitions and detecting fluorescence as well as changes in charge state it was possible to precicely measure transition energies, natural line widths, and properties of resonant photoionization. This provides valuable data for astrophysics and allows to test general atomic theory [2,3].
[1] S. W. Epp et al., Phys. Rev. Lett. 98, 183001 (2007). [2] S. Bernitt et al., Nature 492, 225 (2012). [3] J. K. Rudolph et al., Phys. Rev. Lett. 111, 103002 (2013).