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A: Fachverband Atomphysik

A 35: Poster: Interaction with VUV and X-ray light

A 35.7: Poster

Mittwoch, 19. März 2014, 16:30–18:30, Spree-Palais

Determination of atomic fundamental parameters for quantitative X-ray fluorescence analysis — •Philipp Hönicke, Martin Gerlach, Michael Kolbe, Matthias Müller, Beatrix Pollakowski, Rainer Unterumsberger, and Burkhard Beckhoff — Physikalisch-Technische Bundesanstalt, Abbestr. 2-12, 10587 Berlin

For a reliable quantitative X-ray fluorescence analysis (XRF) exact knowledge of involved atomic fundamental parameters is essential. These parameters include the mass absorption coefficients and photo ionization cross sections, fluorescence yields, Coster-Kronig transition probabilities and others. In this work, fundamental parameters for several chemical elements have been experimentally determined using the radiometrically calibrated XRF instrumentation of the Physikalisch-Technische Bundesanstalt (PTB). In addition, the dependence of selected fundamental parameters on the chemical species of an element of interest was analyzed using high resolution X-ray emission spectrometry. The experiments were carried out at both the laboratory of the PTB at the electron storage ring BESSY II, where monochromatized synchrotron radiation of high spectral purity up to 10 keV is available and at a wavelength shifter beamline (BAMline) at BESSY where higher photon energies are available. The determination of atomic fundamental parameters with low experimental uncertainties leads to significant improvements in quantitative XRF analysis.