Berlin 2014 – wissenschaftliches Programm

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A: Fachverband Atomphysik

A 35: Poster: Interaction with VUV and X-ray light

A 35.9: Poster

Mittwoch, 19. März 2014, 16:30–18:30, Spree-Palais

Soft X-ray emission spectrometry of titanium oxide nanonlayers with an efficient wavelength dispersive spectrometer — •Rainer Unterumsberger, Matthias Müller, and Burkhard Beckhoff — Physikalisch-Technische Bundesanstalt, Abbestr. 2-12, 10587 Berlin

In this work the sensitivity of a calibrated grating spectrometer [1] was improved to analyze nanolayers of different titanium oxides with soft X-ray Emission Spectrometry (XES). The improvement up to a factor of 5 was achieved by a single bounce monocapillary, which is focusing monochromatized soft X-ray undulator radiation down to the micrometer range [2]. Using this set-up, the chemical species was successfully obtained for different titanium compounds by XES. In addition, the transition probabilities of the L-fluorescence lines after an ionization of the L3 subshell were determined. The measurements were carried out at the plane-grating monochromator beamline in the PTB laboratory at BESSY II using monochromatized undulator radiation and calibrated instrumentation [3].

References

[1] M. Müller et al., Phys. Rev. A 79, 032503 (2009)

[2] R. Unterumsberger et al., Spectrochimica Acta Part B 78 (2012) 37-41

[3] B. Beckhoff, J. Anal. At. Spectrom. 23, 845 (2008)