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BE: Beschleunigerphysik

BE 8: Diagnostics and Instrumentation III

BE 8.6: Vortrag

Mittwoch, 2. April 2014, 10:45–11:00, ZEU 255

Non-Invasive Beam Diagnostics for High-Intensity Electron Beams — •Timo Stengler — Helmholtz-Institut Mainz

For high intensity electron machines e.g. magnetized electron cooling devices or energy recovering linacs non-invasive beam diagnostic devices are needed. Therefore a system based on beam induced ?uorescence (BIF) and a system on Thomson scattering was installed at the 100keV electron source test setup at the Mainzer Mikrotron (MAMI). A major concern in these devices is the signal to noise ratio. To improve this ratio dedicated studies on the background are in progress.