Dresden 2014 – wissenschaftliches Programm
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CPP: Fachverband Chemische Physik und Polymerphysik
CPP 16: Interfaces and Thin Films II
CPP 16.6: Vortrag
Dienstag, 1. April 2014, 10:45–11:00, ZEU 114
Studying polymer thin films with GISAXS contrast matching at the silicon K-edge — •Jan Wernecke1, Hiroshi Okuda2, and Michael Krumrey1 — 1Physikalisch-Technische Bundesanstalt, Berlin, Germany — 2Kyoto University, Kyoto, Japan
Grazing-incidence small-angle X-ray scattering (GISAXS) is an ideal tool to study self-organized nanostructures in block-copolymer thin films as it allows for non-destructive, depth-resolved measurements. However, the strong scattering contribution of the film-substrate interface often makes the evaluation of weak scattering features of nanostructures within the film challenging. The reflection can be minimized by matching the scattering contrast of film and substrate to make the interface virtually ‘invisible’ for the X-ray beam. The most widely used substrate material is silicon. This requires to record scattering images in vacuum at around 1.8 keV, which is inaccessible for most digital large-area X-ray detectors. The performance of a newly developed in-vacuum PILATUS 1M detector1 that can be operated down to 1.75 keV is shown in this presentation. The device is used to study structural changes in self-organized PS-b-P2VP thin films under the contrast matching condition at 1827 eV. Depth-resolved GISAXS measurements of the unperturbed scattering features of as-prepared and annealed films are presented and may offer further insights into thermally induced structural modifications along the PS-b-P2VP film thickness.
1 J Wernecke, C Gollwitzer, P Müller & M Krumrey: Characterization of an in-vacuum PILATUS 1M detector, submitted to J. Synchrotron Rad. (2013) arXiv:1311.5082.