Dresden 2014 – scientific programme

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CPP: Fachverband Chemische Physik und Polymerphysik

CPP 54: Poster Session 3

CPP 54.13: Poster

Thursday, April 3, 2014, 15:00–19:00, P2

Simultaneous Mapping of Long-range Attractive and Short-range Repulsive Forces with MUSIC Mode Atomic Force Microscopy — •Diana Voigt, Eike-Christian Spitzner, Fabian Samad, and Robert Magerle — Chemische Physik, Fakultät für Naturwissenschaften, Technische Universität Chemnitz, D-09107 Chemnitz, Germany

Intermittent contact (IC) or tapping mode atomic force microscopy (AFM) usually focuses on the imaging of the surface morphology and the nanomechanical properties. Beyond that also long-range interactions, like electrostatic and magnetic forces, can be measured with AFM. Multi set-point intermittent contact (MUSIC) mode AFM is based on the point-wise measurement of amplitude and phase of an oscillating AFM tip as the tip-sample distance is reduced. It allows for the determination of the unperturbed height image as well as phase images for a wide variety of amplitude set-points from a single measurement run. Furthermore, the results are not affected from feedback-loop and tip-indentation artifacts. Here, we demonstrate the single-pass measurement of long-range attractive electrostatic and magnetic interactions in addition to the nanomechanical properties of the specimen. As model systems for mapping local differences in the hydrophilic/hydrophobic electrostatic interactions we use PS-b-PEO block copolymer thin films on a silicon substrate and collagen fibrils immobilized on PDMS. As a third example, the nanomechanical properties of a thin film of PS-b-PB block copolymer as well as the magnetic properties of an underlying CoPt thin film are measured in a single run.