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DS: Fachverband Dünne Schichten

DS 29: Organic Electronics and Photovoltaics V (joint session with CPP, HL, O)

DS 29.4: Vortrag

Mittwoch, 2. April 2014, 15:45–16:00, ZEU 260

Multi-analytical investigation of SAM formation on printing-relevant time scales II: infrared-reflection-absorption-spectroscopy — •Sabina Hillebrandt^1,5, Janusz Schinke^2,5, Milan Alt^3,4,5, Robert Lovrincic^2,5, Tobias Glaser^1,5, and Annemarie Pucci^1,5 — ¹Universität Heidelberg, Kirchhoff-Institut für Physik — ²Technische Universität Braunschweig, Institut für Hochfrequenztechnik — ³Karlsruher Institut für Technologie — ⁴Merck KGaA, Darmstadt — ⁵Innovationlab GmbH, Heidelberg

In organic semiconductor devices the improvement of charge carrier injection between metal contact and organic semiconductor is a major concern. Self-assembled monolayers (SAMs) built up interface dipoles on metal surfaces that can increase or lower the work function of the material. Therefore SAMs can be used as injection layers. The properties of solution-processed SAMs such as orientation and interface dipole are influenced by various factors like concentration of the molecule in solution, immersion time and purity of the solution or substrate.

Infrared-reflection-absorption-spectroscopy (IRRAS) is very sensitive to changes in the orientation of SAMs on metal surfaces, thus we performed IRRAS measurements on SAMs consisting of 1H,1H,2H,2H-perfluorinated decanethiol on evaporated gold substrates. Orientation, ordering and quality of the SAM were investigated under systematic variation of immersion time and concentration of the molecule in solution. Taking into account realistic printing conditions we also investigated very short immersion times and high concentrations as well as the impact of oxygen in solvent and substrate on the layer formation.