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DS: Fachverband Dünne Schichten
DS 41: Focus Session: Sustainable Photovoltaics with Earth Abundant Materials II
DS 41.9: Vortrag
Donnerstag, 3. April 2014, 17:00–17:15, CHE 91
Raman investigation of Cu2ZnSnSe4 layers with and without preferential grain orientation — •Mario Lang1, Christoph Krämmer1, Johannes Sachs1, Chao Gao1, Sabine Schuster1, Michael Powalla2, Heinz Kalt1, and Michael Hetterich1 — 1Institute of Applied Physics, Karlsruhe Institute of Technology (KIT), 76131 Karlsruhe, Germany — 2Light Technology Institute, KIT, and Zentrum für Sonnenenergie- und Wasserstoff-Forschung Baden-Württemberg (ZSW), 70565 Stuttgart, Germany
Cu2ZnSnSe4 (CZTSe) is attracting more and more attention as an alternative to the well-established Cu(In,Ga)Se2 material system for thin-film photovoltaics due to its composition of earth-abundant elements. Raman spectroscopy is a powerful technique to detect secondary phases in the thin-film absorber layers. Futhermore, using polarization-dependent measurements it is possible to gain information on the crystal orientation when performed on samples with a preferential grain orientation. We present a comparative study of polycrystalline absorber layers with and without a preferential grain orientation. The results are analyzed using theoretical modeling of the Raman line intensities.