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Dresden 2014 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 43: Poster II: Organic thin films; Atomic layer deposition, Thin film characterization: Structure analysis and composition (XRD, TEM, XPS, SIMS, RBS, ...)

Donnerstag, 3. April 2014, 16:00–19:00, P1

16:00 DS 43.1 Influence of surface energetics on perylene thin film growth — •Cathy Jodocy, Daniel Mokros, Mathias Cornelissen, Christian Effertz, Carolin C. Jacobi, and Matthias Wuttig
16:00 DS 43.2 Growth Study of Organic Thin Films - Perylene derivatives on DTC-modified noble metals — •Janina Felter, Daniel Mokros, Dominik Meyer, Ingolf Segger, and Matthias Wuttig
16:00 DS 43.3 Influence of Surface Energetics on Thin Film Evolution — •Daniel Mokros, Christian Effertz, Cathy Jodocy, Mathias Cornelissen, Ingolf Segger, Dominik Meyer, and Carolin Jacobi
16:00 DS 43.4 Manipulating the Electronic Properties of Manganese Phthalocyanine Thin Films by Potassium Intercalation — •Francisc Haidu, Lars Smykalla, Michael Hietschold, and Dietrich R. T. Zahn
16:00 DS 43.5 FePc and CoPc on Ni(111) and graphene/Ni(111): Influence of the central metal atom — •Johannes Uihlein, Heiko Peisert, Hilmar Adler, Mathias Glaser, Małgorzata Polek, and Thomas Chassé
16:00 DS 43.6 Impact of plasmonic nanostructures on the optical properties of fluorinated ZnPc thin films — •Verena Kolb, Michael Brendel, and Jens Pflaum
16:00 DS 43.7 Growth Study of Thermally Evaporated Metal Thin Films on PTCDI-C13 — •Matthias M. Dück, Carolin C. Jacobi, Juri Banchewski, Cathy Jodocy, Christian Effertz, and Matthias Wuttig
16:00 DS 43.8 Investigation of electronic and structural properties of vanadyl phthalocyanine on graphene interlayers on Ni(111) — •Hilmar Adler, Heiko Peisert, Mateusz Paszkiewicz, Johannes Uihlein, Małgorzata Polek, and Thomas Chassé
16:00 DS 43.9 AlClPc on silver: Influence of substrate surface. — •Małgorzata Polek, Tamara V. Basova, Fotini Petraki, Florian Latteyer, Heiko Peisert, and Thomas Chassé
16:00 DS 43.10 PS-b-PMMA block copolymer films: Self-assembly and dielectric properties on different substrates — •Riitta Savikoski, Guillaume Fleury, Andrea Gassmann, Georges Hadziioannou, and Heinz von Seggern
16:00 DS 43.11 Influence of the short interaction range of C60 on nucleation and step-edge barrier during growth — •Sebastian Bommel, Nicola Kleppmann, Sabine H.L. Klapp, and Stefan Kowarik
16:00 DS 43.12 Theoretical analysis of the Anthracene NEXAFS signature — •Michael Klues, Klaus Hermann, and Gregor Witte
16:00 DS 43.13 Optical anisotropy in picene thin films — •Johannes Dieterle, Katharina Broch, Alexander Gerlach, and Frank Schreiber
16:00 DS 43.14 Hydration effects of chitosan on silicon. — •Marcelo Cisternas, Maria J. Retamal, Sebastan Gutierrez, Mark Busch, Patrick Huber, Tomas Perez-Acle, Ulrich Volkmann, and Michael Kappl
16:00 DS 43.15 Growth of Gold on P(VDF-TrFE) During RF-Sputter Deposition — •Alexander Hinz, Oleksandr Polonskyi, Thomas Strunskus, Matthias Schwartzkopf, Gonzalo Santoro, Jan Perlich, Ezzeldin Metwalli, Yuan Yao, Franz Faupel, Stephan Roth, and Peter Müller-Buschbaum
16:00 DS 43.16 Investigation of the thermal stability and structure of 4,4'-dimercaptostilbene on Au(111) — •Johannes Völkner, Andre Pick, and Gregor Witte
16:00 DS 43.17 A comparison of dielectric elastomers and electrostrictive polymers for vibration energy harvesting applications — •Kirstin Bornhorst, Christian Schirrmann, Andreas Weder, Andreas Heinig, and Florenta Costache
16:00 DS 43.18 Crystalline phase formation during the atomic layer deposition of TiO2 — •Barbara Abendroth, Solveig Rentrop, Theresa Moebus, Hartmut Stöcker, and Dirk C. Meyer
16:00 DS 43.19 In-situ gold cluster growth kinetics on polystyrene thin films during sputter deposition - Influence of molecular weight — •Matthias Schwartzkopf, Gonzalo Santoro, Jan Perlich, Oleksandr Polonskyi, Alexander Hinz, Thomas Strunskus, Ezzeldin Metwalli, Yuan Yao, Franz Faupel, Peter Müller-Buschbaum, and Stephan V. Roth
16:00 DS 43.20 Characterization of diamond-like carbon (DLC) coatings on industrial polyethylene and polyoxymethylene by SEM, AFM and NEXAFS — •Liz M. Rösken, Magdalena Rohrbeck, Alberto Catena, Stefan Wehner, Christian B. Fischer, Matthias Richter, Matthias Städter, and Dieter Schmeißer
16:00 DS 43.21 Sputter yield amplification of carbon by serial magnetron co-sputtering — •Patrick Ries, Rüdiger Schmidt, Andreas Pflug, Tomas Kubart, and Matthias Wuttig
16:00 DS 43.22 Al-doped zinc stannate thin films as amorphous transparent conductive oxides prepared by reactive DC magnetron sputtering — •Roland Sittner, Rüdiger Matti Schmidt, and Matthias Wuttig
16:00 DS 43.23 Influence of film thickness on structural properties of TiO2 films coated with RF and DC magnetron sputtering — •Sebastian Schipporeit, Sanat Kumar Mukherjee, Abdelkader Nebatti, Farhad Mohtascham, Christian Notthoff, and Dieter Mergel
16:00 DS 43.24 Pulsed Laser Deposition of thin Metal-Oxide Multilayers for thermal barrier coatings — •Anna Major, Florian Döring, Christian Eberl, Sarah Hoffmann, Felix Schlenkrich, and Hans-Ulrich Krebs
16:00 DS 43.25 High quality TiN as bottom electrode for zinc ferrite based magnetic tunnel junctions grown by pulsed laser deposition — •Michael Bonholzer, Michael Lorenz, and Marius Grundmann
16:00 DS 43.26 Structural and magnetic properties of ultrathin epitaxial magnetite films grown on SrTiO3(001) — •Olga Schuckmann, Nico Pathé, Tobias Schemme, Frederic Timmer, Timo Kuschel, Florian Bertram, Karsten Küpper, and Joachim Wollschläger
16:00 DS 43.27 Thickness dependency of the magnetic anisotropy of iron oxide on MgO(001) — •Tobias Schemme, Nico Pathé, Timo Kuschel, and Joachim Wollschläger
16:00 DS 43.28 Pseudo-rotational Epitaxy of Octadecyltrichlorosilane Monolayers on Sapphire (001) — •Hans-Georg Steinrück, Andreas Magerl, Moshe Deutsch, and Ben Ocko
16:00 DS 43.29 High-resolution TEM investigation of an epitaxially strained LaNiO3/LaGaO3 superlattice — •Haoyuan Qi, Michael Kinyanjui, Eva Benckiser, Hanns-ulrich Habermeier, Bernhard Keimer, and Ute Kaiser
16:00 DS 43.30 Soft X-ray emission spectroscopy used for the characterization of a-C and CNx thin filmsSergej Nepijko, Alisa Chernenkaya, Katerina Medjanik, •Sergey Chernov, Michael Klimenkov, Oleksandr Vlasenko, Svetlana Petrovskaya, Larisa Odnodvorets, Yaroslav Zaulichnyy, and Gerd Schönhense
16:00 DS 43.31 Measurement of lattice parameters of ultrathin films with an improved Guinier diffractometer — •Markus Meyl and Arno Ehresmann
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