Dresden 2014 – scientific programme

Parts | Days | Selection | Search | Updates | Downloads | Help

DS: Fachverband Dünne Schichten

DS 43: Poster II: Organic thin films; Atomic layer deposition, Thin film characterization: Structure analysis and composition (XRD, TEM, XPS, SIMS, RBS, ...)

DS 43.13: Poster

Thursday, April 3, 2014, 16:00–19:00, P1

Optical anisotropy in picene thin films — •Johannes Dieterle, Katharina Broch, Alexander Gerlach, and Frank Schreiber — Universität Tübingen, Institut für Angewandte Physik, Auf der Morgenstelle 10, 72076 Tübingen

The organic semiconductor picene has attracted significant interest due to reports on its excellent charge-transport properties and O₂ gas sensing ability in organic field-effect transistors (OFETs) [1,2]. In thin films picene grows in high columnar islands depending on substrate temperature and growth rate and exhibits uniaxial anisotropic optical properties. For a complete characterization of the system a knowledge of the in-plane as well as the out-of-plane optical properties is fundamental [3,4]. We investigate thin picene films using optical spectroscopy including variable angle spectroscopic ellipsometry in an energy range of 1.5 to 5 eV at different preparation conditions. Due to the complexity of the system only the in-plane component of the system has been reported so far [5]. We discuss results of different growth conditions.

[1] R. Mitsuhashi et al., Nature, 464 (2010), [2] H. Okamoto. et al., Am. Chem. Soc., 130 (2008), [3] T. Hosokai et al., Chem. Phys. Lett., 544 (2012), [4] M. Dressel et al., Opt Express., 16 (2008), [5] S. Fanetti et al. J. Chem. Phys., 137 (2012)