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DS: Fachverband Dünne Schichten

DS 43: Poster II: Organic thin films; Atomic layer deposition, Thin film characterization: Structure analysis and composition (XRD, TEM, XPS, SIMS, RBS, ...)

DS 43.1: Poster

Donnerstag, 3. April 2014, 16:00–19:00, P1

Influence of surface energetics on perylene thin film growth — •Cathy Jodocy, Daniel Mokros, Mathias Cornelissen, Christian Effertz, Carolin C. Jacobi, and Matthias Wuttig — I. Institute of Physics (1A), RWTH Aachen University, D-52056 Aachen, Germany

In recent years, organic semiconductors have received considerable interest. Promising applications include organic field effect transistors (OFETs), organic light-emitting devices (OLEDs) and photovoltaic cells. These devices have in common that they are based on organic thin films, and that they are very sensitive to the order of these films. An understanding of thin film growth is crucial to tailor surface morphologies and organic film properties suitable for specific applications.

The molecule-substrate interaction plays a significant role for resulting film structure. Therefore, the evolution of the growth of perylene thin-films on substrates, which were deposited on self-assembled monolayers (SAMs), was investigated.

In this study, perylene has been used as an organic semiconductor material, which has been deposited both on surfaces treated with SAMs and on clean silicon dioxide. Atomic Force Microscopy (AFM) has been employed to investigate the surface morphology and X-Ray Diffraction (XRD) has been used to determine the crystalline structure of the thin perylene films.