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DS: Fachverband Dünne Schichten

DS 43: Poster II: Organic thin films; Atomic layer deposition, Thin film characterization: Structure analysis and composition (XRD, TEM, XPS, SIMS, RBS, ...)

DS 43.26: Poster

Donnerstag, 3. April 2014, 16:00–19:00, P1

Structural and magnetic properties of ultrathin epitaxial magnetite films grown on SrTiO₃(001) — •Olga Schuckmann¹, Nico Pathé¹, Tobias Schemme¹, Frederic Timmer¹, Timo Kuschel², Florian Bertram³, Karsten Küpper¹, and Joachim Wollschläger¹ — ¹Osnabrück University, Germany — ²Bielefeld University, Germany — ³Lund University, Sweden

In this study, structural and magnetic properties of ultrathin magnetite (Fe₃O₄) films grown on SrTiO₃ (STO) have been investigated. The films of thicknesses between 10 - 120 nm, as determined by x-ray reflectivity (XRR), were deposited on single crystalline niobium doped STO(100) substrates by reactive molecular beam epitaxy (RMBE, Fe evaporation in O₂ atmosphere).
The stoichiometry of the oxide films was controlled by x-ray photoelectron spectroscopy (XPS). The film structure was characterized by high-energy surface x-ray diffraction (HESXRD) using 85 keV photons as well as lab based conventional XRD. The in-plane and out-of-plane lattice parameters show that compressive strain (-7.5 % lattice mismatch) is reduced with increasing film thickness. In addition, the magnetic properties were studied by magnetooptic Kerr effect (MOKE) showing that the thickness and epitaxial strain affect the magnetic anisotropy of the films.