Dresden 2014 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 43: Poster II: Organic thin films; Atomic layer deposition, Thin film characterization: Structure analysis and composition (XRD, TEM, XPS, SIMS, RBS, ...)

DS 43.2: Poster

Donnerstag, 3. April 2014, 16:00–19:00, P1

Growth Study of Organic Thin Films - Perylene derivatives on DTC-modified noble metals — •Janina Felter, Daniel Mokros, Dominik Meyer, Ingolf Segger, and Matthias Wuttig — I. Institute of Physics (IA), RWTH Aachen University, D-52056 Aachen, Germany

Perylene derivatives, such as N,N'-dimethyl-3,4,9,10-perylenetetra-carboxylic diimide (DiMe-PTCDI), are high potential organic semiconductors for thin film applications like organic solar cells (OSC), organic light emitting diodes (OLED) and organic thin film transistors (OTFT). In order to access the full potential of these molecules the structural and electronic thin film properties have to be optimized. To achieve this goal, an in-depth understanding of the molecular ordering is necessary. In recent works, it has been shown that the application of self-assembling monolayers of Dithiocarbamate (DTC) molecules leads to a significant downshift of the work function of Au by 2 eV, which enhances the electron injection from the metal to the active organic layer of an OTFT. In this work, films of perylene derivatives have been deposited by molecular beam deposition (MBD) on smooth noble metal surfaces, which are modified by DTC monolayers. Additionally to their influence on the electronic structure examined by Ultraviolet and X-ray Photoemission Spectroscopy (XPS/UPS), we investigate the molecular orientation by Fourier Transform Infrared Spectroscopy (FTIR). The surface morphology is investigated by Atomic Force Microscopy (AFM), while crystallinity and texture are determined by X-ray Diffractometry (XRD).