Dresden 2014 – wissenschaftliches Programm

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DS: Fachverband Dünne Schichten

DS 43: Poster II: Organic thin films; Atomic layer deposition, Thin film characterization: Structure analysis and composition (XRD, TEM, XPS, SIMS, RBS, ...)

DS 43.3: Poster

Donnerstag, 3. April 2014, 16:00–19:00, P1

Influence of Surface Energetics on Thin Film Evolution — •Daniel Mokros, Christian Effertz, Cathy Jodocy, Mathias Cornelissen, Ingolf Segger, Dominik Meyer, and Carolin Jacobi — I. Institute of Physics (IA), RWTH Aachen University, D-52056 Aachen, Germany

The evolution of the growth of perylene thin-films on substrates, which were energetically modified by polymeric dielectrics such as PDMS and PMMA, was investigated by atomic force microscopy (AFM). Thin-film evolution from a few monolayers to thick films in the case of perylene is a three step process: Initial growth is dominated by the formation of high isolated islands, which show an average height significantly higher than the nominal film thickness. This growth phase is influenced by a significant post-growth behavior. In the second step, the evolution of thin-films undergoes a transition to a more lateral growth mode. In the final growth phase, with increasing amount of deposited material the growing islands coalesce. At the contact point of two islands dislocations can occur. In the case of PDMS modified substrates, the regime of coalescence is accompanied by a pronounced spiral growth. Additionally the PDMS modified substrates show a high crystalline order, which was confirmed by x-ray diffraction (XRD) measurements. By combining measurements of the surface free energy of the differently modified substrates with the scaling relationship of nucleation, we were able to predict a profound influence of the dielectric on thin-film growth kinetics.