Dresden 2014 – scientific programme

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DS: Fachverband Dünne Schichten

DS 43: Poster II: Organic thin films; Atomic layer deposition, Thin film characterization: Structure analysis and composition (XRD, TEM, XPS, SIMS, RBS, ...)

DS 43.7: Poster

Thursday, April 3, 2014, 16:00–19:00, P1

Growth Study of Thermally Evaporated Metal Thin Films on PTCDI-C13 — •Matthias M. Dück, Carolin C. Jacobi, Juri Banchewski, Cathy Jodocy, Christian Effertz, and Matthias Wuttig — I. Physikalisches Institut (IA), RWTH Aachen University, D-52056 Aachen, Germany

Optoelectronic devices based on organic thin films have gained more and more interest over the last few years. The performance of such devices depends critically on the interfaces between the different layers, e.g. the organic layer and the metal electrodes. Especially during the evaporation of metals onto organic thin films various effects can occur, such as thermally induced stress, or diffusion of metal atoms into the organic layer. This is our motivation to study the interface between organic and metallic thin films, in order to be able to optimize functionality of future devices.

Its high electron mobility makes N,N'- ditridecyl-3,4,9,10-perylenetetracarboxylic diimide (PTCDI-C13) a promising n-type material for organic field effect transistors (OFETs). In this work, thin films of various metals have been deposited by thermal evaporation on 30 nm PTCDI-C13 films produced with Organic Molecular Beam Deposition (OMBD). The surface morphology has been investigated by atomic force microscopy (AFM) and scanning electron microscopy (SEM), whereas the crystallinity was determined by x-ray diffractometry (XRD).