Bereiche | Tage | Auswahl | Suche | Aktualisierungen | Downloads | Hilfe
DS: Fachverband Dünne Schichten
DS 44: Poster III: Focus session: Resistive switching by redox and phase change phenomena
DS 44.18: Poster
Donnerstag, 3. April 2014, 16:00–19:00, P1
An alternative route for crossing the metal-insulator transition in GeTe-Sb2Te3-alloys — •Annika Poitz, Hanno Volker, Peter Jost, Peter Zalden, Tobias Schäfer, and Matthias Wuttig — I. Physikalisches Institut (IA), RWTH Aachen, 52056 Aachen
Phase-change materials (PCMs) are outstanding materials: Besides a fast transition between the amorphous and the crystalline state, these materials show a high contrast in their optical and electrical properties. Due to these properties PCMs can be employed in optical and electrical memory technologies.
Recently it has been demonstrated[1] that the resistivity in the crystalline phase in some PCMs such as Ge1Sb2Te4 depends on the annealing temperature. Higher annealing temperatures lead to smaller resistivities and even a change from non-metallic to metallic behavior. This is explained by a reduction of disorder upon annealing, which leads to a disorder-driven metal-insulator transition (MIT). This MIT has been proven to be independent of structural transitions[1]. However Ge1Sb2Te4 shows a cubic to trigonal transition near the MIT, which hampers a clear distinction between the influences of disorder and crystalline structure.
In this study we report an MIT in PCMs without such a structural change. Instead of annealing, we control disorder by varying the stoichiometry of (Sb2Te3)1-x(GeTe)x-alloys with 0.75≤ x ≤ 1. In this study we employ low- and high-temperature resistivity, Hall-effect and XRD measurements for a characterization of the samples.
[1] T. Siegrist et al., Nat. Mat. 10, 202 (2011)