Dresden 2014 – wissenschaftliches Programm
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DS: Fachverband Dünne Schichten
DS 6: Thin Film Characterization: Structure Analysis and Composition (XRD, TEM, XPS, SIMS, RBS,...)
DS 6.13: Vortrag
Montag, 31. März 2014, 18:30–18:45, CHE 89
Structural characterization of CeO2 thin films grown on Yttria-Stabilized Zirconia — •Björn Arndt1,2, Patrick Müller1,2, Heshmat Noei1, Thomas Keller1, Vedran Vonk1, Andreas Nenning3, Jürgen Fleig3, and Andreas Stierle1,2 — 1Deutsches Elektron-Synchrotron (Desy), D-22607 Hamburg, Germany — 2Fachbereich Physik, Universität Hamburg, D-20355 Hamburg, Germany — 3Institute of Chemical Technologies and Analytics, Vienna University of Technology, 1060 Vienna, Austria
Apart from its use in catalytic converters, CeO2 offers a variety of possible applications: for hydrogen production via photon induced water-splitting, as a support for metal nanoparticles, or as an electrolyte or anode material for Solid-Oxide Fuel Cells. The reason for this lies in the ability of CeO2 to form oxygen vacancies in the bulk and at the surface, thus being able to store, conduct and release oxygen. Doping with a trivalent oxide (in this case Gadolinia) induces oxygen vacancies, making them available under non-reducing conditions. For a better understanding of the above mentioned properties of Ceria, it is important to study its structure under oxygen-deficient conditions. Therefore, 10% Gd-doped CeO2 thin films were grown on Yttria-Stabilized Zirconia (110) and (111) by pulsed laser deposition, inducing a nominally 5% oxygen vacancy concentration in the films. The films were studied by grazing incidence x-ray diffraction, x-ray reflectivity and atomic force microscopy. XRD-Measurements were performed at the ID03-Beamline at the ESRF as well as using a conventional lab source. The films are shown to be atomically smooth and epitaxial to the YSZ substrates.