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DS: Fachverband Dünne Schichten
DS 6: Thin Film Characterization: Structure Analysis and Composition (XRD, TEM, XPS, SIMS, RBS,...)
DS 6.17: Talk
Monday, March 31, 2014, 19:30–19:45, CHE 89
Resonant Soft X-Ray Reflectometry on strained LaSrMnO4 thin films — •Martin Zwiebler1, Jorge Enrique Hamann-Borrero1, Mehran Vafaee2, Ronny Sutarto3, Feizhou He3, Lambert Alff2, Bernd Büchner1, and Jochen Geck1 — 1IFW Dresden, Helmholtzstraße 20, 01097 Dresden, Germany — 2Institute of Material Sciences, Technische Universität Darmstadt, 64287 Darmstadt, Germany — 3Canadian Light Source Inc., 44 Innovation Boulevard, Saskatoon SK S7N 2V3, Canada
The strong electron-lattice coupling in the perovskite manganites provides a unique opportunity to tune the electronic properties of these materials via lattice strain. LaSrMnO4 is a good model material with well-known orbital occupation in the bulk material. We present a study of the depth-resolved electronic properties in a tensile strained LaSrMnO4 film by the means of resonant X-ray reflectometry (RXR) and XAS. We find evidence for Mn2+ on the surface and we extract the depth profile of the Mn valence throughout the film.