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Dresden 2014 – scientific programme

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KR: Fachgruppe Kristallographie

KR 12: Functional Materials - Analysis with EBSD, X-Ray Kossel Diffraction and Related Methods (MI jointly with KR)

Thursday, April 3, 2014, 09:30–11:00, MER 02

09:30 KR 12.1 Invited Talk: The martensitic transformation in Co-Ni-Al F-SMA — •Jaromír Kopeček, Karel Jurek, Michal Landa, and Oleg Heczko
10:00 KR 12.2 Charakterisierung flächenhafter Inhomogenitäten in der ferromagnetischen Formgedächtnislegierung Co38Ni33Al29 mittels Kossel- und Pseudo-Kossel-TechnikEnrico Langer, Siegfried Däbritz, •Leonid P. Potapov, Katerina Kratka und Jaromír Kopeček
10:15 KR 12.3 Strain inhomogeneities in epitaxial BaFe2As2 thin films measured by cross correlation electron backscatter diffraction — •Paul Chekhonin, Jan Engelmann, Bernhard Holzapfel, Carl-Georg Oertel, and Werner Skrotzki
10:30 KR 12.4 Simulation of phase propagation delay for modulated EBIC in thin Silicon samples — •Markus Holla, Markus Ratzke, Winfried Seifert, and Martin Kittler
10:45 KR 12.5 Characterization of 0-3 high permittivity composite capacitors for energy storage — •Jens Glenneberg, Gerald Wagner, Thomas Großmann, Stefan Ebbinghaus, Martin Diestelhorst, Sebastian Lemm, Horst Beige, and Hartmut Leipner
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