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KR: Fachgruppe Kristallographie
KR 9: Recent Developments in X-ray Diffraction
KR 9.1: Vortrag
Donnerstag, 3. April 2014, 10:15–10:30, CHE 184
A diffraction effect in X-ray area detectors — •Christian Gollwitzer and Michael Krumrey — Physikalisch-Technische Bundesanstalt, Berlin, Germany
When an X-ray area detector with a single-crystalline sensor layer, such as a
hybrid pixel detector, is used to record a scattering or diffraction image,
a pattern of lines can appear which overlays the detected images.1
This pattern with an intensity decrease of up to 20% is caused by diffraction in the sensor layer.
Experimental images of a modular PILATUS 1M
detector2 together with a theory are presented over a photon energy range from 3.4 keV to
10 keV. The effect can be exploited to measure the photon energy of
the beam and angular misalignment of the detector.
1 C Gollwitzer & M Krumrey: A diffraction effect in X-ray area detectors, submitted to J. Appl. Cryst. (2013) arXiv:1308.6525
2 J Wernecke, C Gollwitzer, P Müller & M Krumrey: Characterization of an in-vacuum PILATUS 1M detector, submitted to J. Synchrotron Rad. (2013) arXiv:1311.5082