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KR: Fachgruppe Kristallographie
KR 9: Recent Developments in X-ray Diffraction
Donnerstag, 3. April 2014, 10:15–11:00, CHE 184
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10:15 | KR 9.1 | A diffraction effect in X-ray area detectors — •Christian Gollwitzer and Michael Krumrey |
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10:30 | KR 9.2 | Beam Conditioning in Cutting Edge X-ray Analytical Equipment — •Jörg Wiesmann, André Beerlink, Andreas Kleine, Jürgen Graf, Frank Hertlein, and Carsten Michaelsen |
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10:45 | KR 9.3 | Analyzing high pressure diffraction data of perovskites with parametric Rietveld refinement and rotational symmetry modes of a rigid body — •Martin Etter, Melanie Müller, Michael Hanfland, and Robert E. Dinnebier |