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MA: Fachverband Magnetismus
MA 19: Poster I
MA 19.43: Poster
Dienstag, 1. April 2014, 13:00–15:30, P1
quantitative magnetic imaging at the nanometer scale by ballistic electron magnetic microscopy — •hervé marie1,2, sylvain tricot1, sophie guézo1, gabriel delhaye1, bruno lépine1, philippe schieffer1, and pascal turban1 — 1Département Matériaux-Nanosciences - Institut de Physique de Rennes, Rennes, France — 2Physikalisches Institut, Karlsruhe Institute of Technology (KIT),Karlsruhe, Germany
Ballistic Electron Magnetic Microscopy (BEMM) is a unique experimental tool allowing characterization of electronic properties of buried interfaces with nanometric lateral resolution. In BEMM experiments, hot electrons are injected from an STM tip into a spin-valve/semiconductor heterostructure. The hot electron current collected at the back of the substrate is modulated by magnetoresistive effects.
We report in this communication an investigation of sub-micrometric spin valves Fe/Au/Fe/GaAs with an Fe electrode evaporated through a nanostencil. In these structures, the modulation of the collected current by the local magnetic domain structure in the Fe dots allows magnetic imaging of buried nanostructures with strong contrast (500%) and a nanometric lateral resolution. The experimental magnetocontrast observed on these sub-micrometric Fe dots are in excellent agreement with BEEM current maps calculated via micromagnetic simulations. This opens the way to a quantitative magnetic microscopy technique with a high sensitivity and a nanometric lateral resolution [1].
[1] M. Hervé et al., J. Appl. Phys. 113, 233909 (2013)