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MA: Fachverband Magnetismus
MA 30: Experimental methods and magnetic imaging
MA 30.11: Vortrag
Mittwoch, 2. April 2014, 17:45–18:00, HSZ 403
Non-contact bimodal Magnetic Force Microsopy — •Johannes Schwenk1, Miguel Marioni1, Niraj Joshi1, Sara Romer1, and Hans-Josef Hug1,2 — 1Empa, Swiss Federal Laboratories for Materials Science and Technology, CH-8600 Dübendorf, Switzerland. — 2Department of Physics, University of Basel, CH-4056 Basel, Switzerland
We present a bimodal Magnetic Force Microscopy technique which is capable to reveal the magnetic stray field of a sample as well as the corresponding topography in a single pass scan. Being single pass makes the technique independet from all kinds of instrumental drift and allows to scan with lowest tip sample separation. Therefore it provides high lateral resolution since the tip interacts with low range magnetic stray fields of small magnetic features. The bimodal technique is suitable for vacuum conditions and stable for high Q and soft cantilevers that are necessary for high sensitivity measurements.