MI 3: Analytical Transmission Electron Microscopy and Atom Probe Tomography
Dienstag, 1. April 2014, 09:30–11:00, MER 02
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09:30 |
MI 3.1 |
Hauptvortrag:
In situ transmission electron microscopy studies of one-dimensional materials — •Vadim Migunov, Zi-An Li, Spasova Marina, Michael Farle, and Rafal E. Dunin-Borkowski
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10:00 |
MI 3.2 |
New Applications in Atom Probe Tomography — •H.-Ulrich Ehrke
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10:30 |
MI 3.3 |
Stapelfehler als Ursache für Degradation von Si-Solarzellen — •Volker Naumann, Dominik Lausch, Andreas Graff, Jan Bauer, Angelika Hähnel, Otwin Breitenstein, Stephan Großer und Christian Hagendorf
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10:45 |
MI 3.4 |
Microstructural Investigation of Recombination Active Defects in Multicrystalline Silicon Solar Cells — •Dominik Lausch, Angelika Hähnel, Martina Werner, Jan Bauer, Otwin Breitenstein, and Christian Hagendorf
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