MI 8: Poster: Microanalysis and Microscopy
Mittwoch, 2. April 2014, 17:00–19:30, P4
 |
17:00 |
MI 8.1 |
Development of a µm-positron beam for non-destructive 3D-defect imaging — •Thomas Gigl, Markus Reiner, Christian Piochacz, and Christoph Hugenschmidt
|
|
|
|
17:00 |
MI 8.2 |
Improved algorithm for the determination of the Fermi surface in correlated systems using positrons — •Josef Andreas Weber, Hubert Ceeh, Liviu Chioncel, Christoph Hugenschmidt, Michael Leitner, and Peter Böni
|
|
|
|
17:00 |
MI 8.3 |
Analyse leichter Elemente mittels Kernreaktionsanalyse an der Ionenstrahlmikrosonde — •Christian Freiherr, Fabienne Eder, Silke Merchel, Frans Munnik, Christian Neelmeijer und Axel D. Renno
|
|
|
|
17:00 |
MI 8.4 |
Determination of trap and band states in organic field-effect transistors by scanning Kelvin probe microscopy — •Sebastian Hietzschold, Michael Scherer, Janusz Schinke, Robert Lovrincic, and Wolfgang Kowalsky
|
|
|
|
17:00 |
MI 8.5 |
Sensitivity in SubSurface-AFM: Tip-Sample Interaction in Heterodyne Force Microscopy — •Gerard J. Verbiest, Tjerk H. Oosterkamp, and Marcel J. Rost
|
|
|
|
17:00 |
MI 8.6 |
Prototyping of Cobalt MFM tips with high spatial resolution using electron beam induced deposition — •Johannes J.L. Mulders and Daniela Sudfeld
|
|
|
|
17:00 |
MI 8.7 |
Imaging applications and fabrication process of x-ray wave- guides — •Sarah Hoffmann, Henrike Neubauer, Mike Kanbach, Anna-Lena Robisch, and Tim Salditt
|
|
|
|
17:00 |
MI 8.8 |
Diffractive Optics Research at Max Planck Institute for Intelligent Systems in Stuttgart — •Kahraman Keskinbora, Umut Tunca Sanli, Marcel Mayer, Corinne Grévent, and Gisela Schütz
|
|
|
|
17:00 |
MI 8.9 |
Status and upgrades of the MAXYMUS X-ray microscope — •Iuliia Bykova, Markus Weigand, Michael Bechtel, Claudia Stahl, Eberhard Goering, and Gisela Schütz
|
|
|
|
17:00 |
MI 8.10 |
Study of core-shell nanowires by kinematic scattering theory — •Thilo Krause and Michael Hanke
|
|
|