MI 9: Functional Materials - Analysis with EBSD, X-Ray Kossel Diffraction and Related Methods (MI jointly with KR)
Donnerstag, 3. April 2014, 09:30–11:00, MER 02
 |
09:30 |
MI 9.1 |
Hauptvortrag:
The martensitic transformation in Co-Ni-Al F-SMA — •Jaromír Kopeček, Karel Jurek, Michal Landa, and Oleg Heczko
|
|
|
|
10:00 |
MI 9.2 |
Charakterisierung flächenhafter Inhomogenitäten in der ferromagnetischen Formgedächtnislegierung Co38Ni33Al29 mittels Kossel- und Pseudo-Kossel-Technik — Enrico Langer, Siegfried Däbritz, •Leonid P. Potapov, Katerina Kratka und Jaromír Kopeček
|
|
|
|
10:15 |
MI 9.3 |
Strain inhomogeneities in epitaxial BaFe2As2 thin films measured by cross correlation electron backscatter diffraction — •Paul Chekhonin, Jan Engelmann, Bernhard Holzapfel, Carl-Georg Oertel, and Werner Skrotzki
|
|
|
|
10:30 |
MI 9.4 |
Simulation of phase propagation delay for modulated EBIC in thin Silicon samples — •Markus Holla, Markus Ratzke, Winfried Seifert, and Martin Kittler
|
|
|
|
10:45 |
MI 9.5 |
Characterization of 0-3 high permittivity composite capacitors for energy storage — •Jens Glenneberg, Gerald Wagner, Thomas Großmann, Stefan Ebbinghaus, Martin Diestelhorst, Sebastian Lemm, Horst Beige, and Hartmut Leipner
|
|
|