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So, 16:00–18:15 |
HSZ 201 |
MI 1: Festkörpercharakterisierung mit Positronen |
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Mo, 10:00–13:00 |
MER 02 |
MI 2: Untersuchung von kondensierter Materie mittels Positronen-Annihilation |
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Di, 09:30–11:00 |
MER 02 |
MI 3: Analytical Transmission Electron Microscopy and Atom Probe Tomography |
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Di, 11:15–12:00 |
MER 02 |
MI 4: Scanning Probe Microscopy |
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Mi, 09:30–10:45 |
MER 02 |
MI 5: Ion Beam Methods |
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Mi, 11:00–12:00 |
MER 02 |
MI 6: X-ray Imaging, Holography and Tomography |
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Mi, 15:00–17:15 |
MOL 213 |
MI 7: Synchrotron Radiation (Focus Session with Accelerator Physics) |
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Mi, 17:00–19:30 |
P4 |
MI 8: Poster: Microanalysis and Microscopy |
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Do, 09:30–11:00 |
MER 02 |
MI 9: Functional Materials - Analysis with EBSD, X-Ray Kossel Diffraction and Related Methods (MI jointly with KR) |
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Do, 11:00–11:45 |
CHE 184 |
MI 10: Crystallography in Nanoscience (KR jointly with MI) |
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Do, 15:00–17:30 |
CHE 184 |
MI 11: Crystallography in Materials Science (KR jointly with DF, MI) |
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