Dresden 2014 – wissenschaftliches Programm

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MM: Fachverband Metall- und Materialphysik

MM 42: Electron Microscopy II - Advances in characterisation

MM 42.4: Vortrag

Mittwoch, 2. April 2014, 12:45–13:00, IFW B

4D X-ray microscopy (XRM), In Situ imaging of practical volume samples — •Lars-Oliver Kautschor — Carl Zeiss Microscopy GmbH

In situ, 4D microscopy using X-ray microscopy is evolving as a valuable scientific technique. In order to develop this further it is important to develop the technique using realistic representative volumes in a wide range of materials. It is also important to evaluate the efficacy of the application against more traditional methods by employing correlative imaging. Conventional electron and optical microscopy techniques require the sample to be sectioned, polished or etched to expose the internal surfaces for imaging. However, such sample preparation techniques have traditionally prevented the observation of the same sample over time, under realistic three-dimensional geometries and in an environment representative of real-world operating conditions. X-ray microscopy (XRM) is a rapidly emerging technique that enables non-destructive evaluation of buried structures within hard to soft materials in 3D, requiring little to no sample preparation. Furthermore in situ and 4D quantification of microstructural evolution under controlled environment as a function of time, temperature, chemistry or stress can be performed repeatably on the same sample, using practical specimen sizes ranging from tens of microns to several cm diameter, with achievable spatial imaging resolution from submicron to 50 nm.